ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,166, issued on March 3, was assigned to CODELCOTEC SPA (Santiago, Chile).

"Mineralogical analysis system of copper concentrate" was invented by Leonel Contreras Rojas (Santiago, Chile), Victor Duarte Olave (Santiago, Chile), Eduardo Rodriguez Seguel (Santiago, Chile) and Patricio Lara Torres (Santiago, Chile).

According to the abstract* released by the U.S. Patent & Trademark Office: "This invention patent application addresses a system for the detection and quantification of mineralogical species via x-ray diffraction (XRD) of the concentrate of dry copper before it is injected into a converter or melting furnace. Specifically, it addresses a device that performs a mineralogical...