US Patent Issued to CKD on Nov. 3 for "Packaged item inspection device and packaged item inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,780,476, issued on Nov. 3, was assigned to CKD Corp. (Aichi, Japan).

"Packaged item inspection device and packaged item inspection method" was invented by Yukihiro Taguchi (Aichi, Japan), Shiori Imaizumi (Aichi, Japan) and Shozo Oda (Aichi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A packaged item inspection device includes: an illumination device that irradiates the packaged item with ultraviolet light; an imaging device that images the ultraviolet light reflected from the packaged item and obtains regular reflection light image data of the packaged item; and a hardware processor that determines whether the packaging material in the packaged ...