US Patent Issued to CHUNGHWA PRECISION TEST TECH. on Sept. 8 for "Probe card device having expansion configuration and probe head thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,129, issued on Sept. 8, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan).

"Probe card device having expansion configuration and probe head thereof" was invented by Yu-Ju Lu (Taoyuan City, Taiwan), Hao-Yen Cheng (Taoyuan City, Taiwan), Rong-Yang Lai (Taoyuan City, Taiwan) and Wei-Jhih Su (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe head of a probe card device includes two guide board modules spaced apart from each other, a plurality of conductive probes, and an auxiliary probe, the latter two of which are assembled to the two guide board modules. At least one of the conductive probes abuts...