US Patent Issued to CHUNGHWA PRECISION TEST TECH. on March 31 for "Cantilever probe card device and micro electro mechanical system (MEMS) probe" (Taiwanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,990, issued on March 31, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan).

"Cantilever probe card device and micro electro mechanical system (MEMS) probe" was invented by Hao-Yen Cheng (Taoyuan City, Taiwan), Rong-Yang Lai (Taoyuan City, Taiwan), Chao-Hui Tseng (New Taipei City, Taiwan) and Wei-Jhih Su (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A micro electro mechanical system (MEMS) probe includes an arm segment, a main segment, and a testing segment. The main segment is arranged at one side of the arm segment, the main segment defines a layout region arranged inside of an outer contour ther...