ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,760, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan).
"Probe card device and tunnel-type probe thereof" was invented by Yu-Ju Lu (Taoyuan City, Taiwan), Yi-Hsien Chen (Taoyuan City, Taiwan), Meng-Chieh Cheng (Taipei City, Taiwan) and Wei-Jhih Su (Taichung City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A tunnel-type probe includes a tube, an elastic member, and a pin. The elastic member is assembled in the tube. The pin is movably disposed through the tube, and is electrically coupled to the tube by being connected to the elastic member. The pin has an inner segment, a contacting segment...