US Patent Issued to CHINA NIL RESEARCH CENTER FOR PROFICIENCY TESTING on July 21 for "Preparation method of simulated specimen for non-destructive testing of metal materials" (Chinese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,522, issued on July 21, was assigned to CHINA NIL RESEARCH CENTER FOR PROFICIENCY TESTING (Beijing).

"Preparation method of simulated specimen for non-destructive testing of metal materials" was invented by Liang Zhang (Beijing), Haizhou Wang (Beijing), Lingtian Tang (Beijing) and Yongyan Chen (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a method for preparing simulated samples for non-destructive testing of metal materials, which can carry out reverse batch copying of cavity-type defect samples, specifically: obtaining metal samples with natural and real cavity-type defects; using high-resolution X-ray industrial...