US Patent Issued to China Jikan Research Institute Of Engineering Investigations And Design, Xi'an Jiaotong University on Oct. 27 for "Non-invasive time domain reflection probe calibration method and system" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,975, issued on Oct. 27, was assigned to China Jikan Research Institute Of Engineering Investigations And Design Co. Ltd (Xi'an, China) and Xi'an Jiaotong University (Xi'an, China).

"Non-invasive time domain reflection probe calibration method and system" was invented by Jie Cao (Xi'an, China), Long Wang (Xi'an, China), Jiwen Zhang (Xi'an, China), Zaixin Wan (Xi'an, China), Qingyi Mu (Xi'an, China), Dongjing Wang (Xi'an, China), Yuanqiang Zhou (Xi'an, China), Zhi Liu (Xi'an, China), Long Zhang (Xi'an, China), Hui Li (Xi'an, China), Jian Chen (Xi'an, China), Teng Yang (Xi'an, China), Lei Ran (Xi'an, China), Jiao Lin (Xi'an, China), Xiao Dong (Xi'an, China), Shuai Liu (Xi'an, China) ...