US Patent Issued to Chang Gung Memorial Hospital, Linkou on Sept. 8 for "Method and kit for testing drug hypersensitivity reactions caused by sulfonamide derivative-based antiepileptic drug and use of the kit" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,404, issued on Sept. 8, was assigned to Chang Gung Memorial Hospital, Linkou (Taoyuan, Taiwan).

"Method and kit for testing drug hypersensitivity reactions caused by sulfonamide derivative-based antiepileptic drug and use of the kit" was invented by Wen-Hung Chung (Taoyuan, Taiwan), Shuen-Iu Hung (Taoyuan, Taiwan) and Chuang-Wei Wang (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a method for assessing the risk of drug hypersensitivity reaction caused by an antiepileptic drug with a sulfonamide derivative in a subject in need of such an assessment, comprising the step of detecting the presence of HLA-B...