US Patent Issued to CHANG GUNG MEMORIAL HOSPITAL, LINKOU on Nov. 11 for "Method for assessing risk of cutaneous adverse drug reactions caused by epidermal growth factor receptor inhibitors, detection kit thereof, and use thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,090, issued on Nov. 11, was assigned to CHANG GUNG MEMORIAL HOSPITAL, LINKOU (Taoyuan, Taiwan).

"Method for assessing risk of cutaneous adverse drug reactions caused by epidermal growth factor receptor inhibitors, detection kit thereof, and use thereof" was invented by Wen-Hung Chung (Taoyuan, Taiwan), Shuen-Iu Hung (Taoyuan, Taiwan), Chun-Bing Chen (Taoyuan, Taiwan), Chun-Wei Lu (Taoyuan, Taiwan) and Chuang-Wei Wang (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for assessing the risk of cutaneous adverse drug reactions (CADRs) caused by an epidermal growth factor receptor inhibitor is provided, wherein the CADRs comprises...