US Patent Issued to Cepheid on Feb. 3 for "Integrated purification and measurement of DNA methylation and co-measurement of mutations and/or mRNA expression levels in an automated reaction cartridge" (California, Washington Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,539,510, issued on Feb. 3, was assigned to Cepheid (Sunnyvale, Calif.).

"Integrated purification and measurement of DNA methylation and co-measurement of mutations and/or mRNA expression levels in an automated reaction cartridge" was invented by Edwin Wei-Lung Lai (Santa Clara, Calif.), Andrew Kohlway (Santa Clara, Calif.), Reuel Van Atta (Sunnyvale, Calif.), Russell Higuchi (Alameda, Calif.), Alexander A. Gall (Woodinville, Wash.) and Kriszten Kocmond (Los Altos, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods of determining methylation of DNA are provided that include filtering a biological sample comprising a nucleic acid with a first ma...