US Patent Issued to Carl Zeiss X-ray Microscopy on Sept. 15 for "Multi-fraction sample holder for 3D particle analysis" (California Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,485, issued on Sept. 15, was assigned to Carl Zeiss X-ray Microscopy Inc. (Dublin, Calif.).

"Multi-fraction sample holder for 3D particle analysis" was invented by Matthew Andrew (Livermore, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An x-ray minerology analysis system includes a sample assembly for an x-ray microscopy system. It comprises an outer tube and a bottom plug sealing an inner bore of the outer tube, wherein the outer tube contains powder to be analysed by the x-ray microscopy system."

The patent was filed on Oct. 20, 2022, under Application No. 18/048,187.

*For further information, including images, charts and tables, pleas...