US Patent Issued to Carl Zeiss SMT on March 24 for "Apparatus for analyzing and/or processing a sample with a particle beam and method" (German Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,755, issued on March 24, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany).

"Apparatus for analyzing and/or processing a sample with a particle beam and method" was invented by Ottmar Hoinkis (Darmstadt, Germany), Jan Guentner (Gross-Zimmern, Germany), Daniel Rhinow (Frankfurt am Main, Germany), Hubertus Marbach (Grossostheim, Germany) and Nicole Auth (Ginsheim-Gustavsburg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for analyzing and/or processing a sample with a particle beam includes a providing unit for providing the particle beam, and a shielding element for shielding an electric field (E) generated by charges (...