US Patent Issued to Carl Zeiss Microscopy on Oct. 27 for "Operating a particle beam apparatus" (German Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,469, issued on Oct. 27, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Operating a particle beam apparatus" was invented by Sebastian Schaedler (Oberkochen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Operating a particle beam apparatus includes processing, imaging, and/or analyzing an object. When guiding the particle beam along first dwell regions of a first scan line, the particle beam remains at each of the first dwell regions for a first dwell time. When guiding the particle beam along second dwell regions of a second scan line, the particle beam remains at each of the second dwell regions for a second dwell time. The f...