US Patent Issued to Carl Zeiss Microscopy on June 23 for "Method for preparing a microscopic sample for FIB/SEM tomography" (Virginia Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,165, issued on June 23, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Method for preparing a microscopic sample for FIB/SEM tomography" was invented by Lorenz Lechner (Arlington, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for preparing a volume of interest from a bulk sample uses a particle beam system configured to accommodate and to image the bulk sample and configured to provide a particle beam for the removal of material from the bulk sample. Moreover, the particle beam system is configured to define trimming regions. A trimming region determines location and size of a volume to be removed from the bulk sample." ...