US Patent Issued to Canon on Oct. 20 for "Examination apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,765,764, issued on Oct. 20, was assigned to Canon K.K. (Tokyo).

"Examination apparatus" was invented by Hiroto Kano (Tochigi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An examination apparatus detecting first reflected light from a first eye of a subject and second reflected light from a second eye of the subject includes an imaging device, and a processing unit. The imaging device includes pixels each including a first photoelectric conversion unit and a second photoelectric conversion unit. The processing unit includes a unit configured to acquire a first signal based on the first reflected light entering the first photoelectric conversion ...