US Patent Issued to Canon on July 21 for "Apparatus and method for deep-learning-based scatter estimation and correction" (Illinois Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,633, issued on July 21, was assigned to Canon K.K. (Tokyo).

"Apparatus and method for deep-learning-based scatter estimation and correction" was invented by Yujie Lu (Vernon Hills, Ill.), Liang Cai (Vernon Hills, Ill.) and Jian Zhou (Buffalo Grove, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to some embodiments, a method comprises obtaining a set of projection data acquired from a CT scan of an object; generating, based on the set of projection data, one or more sets of preliminary scattering data; and performing X-ray scatter correction by inputting the obtained set of projection data and the generated one or more sets of prelimin...