US Patent Issued to CANON on July 14 for "Inspection apparatus that extracts a predetermined area, inspection method, and storage medium" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,447, issued on July 14, was assigned to CANON K.K. (Tokyo).

"Inspection apparatus that extracts a predetermined area, inspection method, and storage medium" was invented by Shunsuke Iwano (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "From one of an inspection image of a printed material and a reference image, a predetermined area including an edge is extracted and a pixel value of a pixel is corrected, which configures the predetermined area in the inspection image or the reference image, from which the predetermined area has been extracted, and a blot on the printed material is detected by using collation results of the corrected ...