ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,702,374, issued on Aug. 11, was assigned to Canon K.K. (Tokyo).
"X-ray detector and control method" was invented by Akira Nishijima (Nasushiobara, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray detector according to an embodiment is an X-ray detector of photon counting type including a plurality of detection elements and a voltage supply device configured to supply the detection elements with a voltage for reading out electric charges accumulated in the detection elements irradiated with X-rays, and the X-ray detector includes processing circuitry configured to: identify target elements from among the detection elements based on informati...