US Patent Issued to California Institute of Technology, TOTALENERGIES E&P RESEARCH & TECHNOLOGY USA on May 19 for "Systems and methods for monitoring the surface temperature of an object using an imager and the temperature-dependent absorption properties of semiconductors" (American, French Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,495, issued on May 19, was assigned to California Institute of Technology (Pasadena, Calif.) and TOTALENERGIES E&P RESEARCH & TECHNOLOGY USA INC. (Courbevoie, France).

"Systems and methods for monitoring the surface temperature of an object using an imager and the temperature-dependent absorption properties of semiconductors" was invented by Axel Scherer (Barnard, Vt.), Paromita Mitchell (Pasadena, Calif.), John Richard Ordonez-Varela (Lescar, France) and Jack Jewell (Boulder, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature monitoring system includes a semiconductor member mounted onto the surface of an object having a surface whos...