US Patent Issued to BRUKER SWITZERLAND on Nov. 3 for "Ion analysis apparatus and method" (Swiss Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,058, issued on Nov. 3, was assigned to BRUKER SWITZERLAND AG (Fallanden, Switzerland).

"Ion analysis apparatus and method" was invented by Dimitris Papanastasiou (Fallanden, Switzerland), Melvin Park (Fallanden, Switzerland), Benjamin Jones (Fallanden, Switzerland) and Mark Ridgeway (Fallanden, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus comprises an array of RF ion accumulation devices, including a first RF ion accumulation device having a first ion entrance, a first ion exit, and a first set of electrodes, including a first electrode disposed at, proximal and/or adjacent to the first ion exit. An ion fragmentation device...