US Patent Issued to BRUKER NANO on April 7 for "Proximity sensor for electron backscatter diffraction systems" (German Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,082, issued on April 7, was assigned to BRUKER NANO GMBH (Berlin).

"Proximity sensor for electron backscatter diffraction systems" was invented by Daniel Radu Goran (Berlin).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention refers to a proximity sensor for electron backscatter diffraction (EBSD) systems, particularly, a proximity sensor for collision avoidance between an EBSD sensor of an EBSD system and a stage of a scanning electron microscope (SEM) equipped with the EBSD system, and a corresponding method for proximity monitoring. The proximity sensor comprises emitter(s) to provide a light beam or light curtain which is basical...