US Patent Issued to Bruin Biometrics on June 2 for "SEM trend analysis" (California Inventor)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,642,481, issued on June 2, was assigned to Bruin Biometrics LLC (Los Angeles).

"SEM trend analysis" was invented by Martin F. Burns (Los Angeles).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides for, and includes, a method of detecting tissue damage before it is visible on a patient's skin, comprising: measuring a plurality of sub-epidermal moisture (SEM) values at a single location at incremental times, calculating a slope between the latest SEM value and the immediately prior SEM value, comparing this slope to a threshold value, and determining that there is tissue damage if the slope exceeds the threshold value."

The pate...