US Patent Issued to Brown University on June 23 for "System and method for scanning near-field optical microscopy" (Rhode Island, Connecticut Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,435, issued on June 23, was assigned to Brown University (Providence, R.I.).

"System and method for scanning near-field optical microscopy" was invented by Daniel Mittleman (Providence, R.I.) and Angela Pizzuto (Pine Meadow, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for scanning near-field optical microscopy comprises illuminating an apertureless atomic force microscopy (AFM) probe with electromagnetic energy having a frequency in the Terahertz range, where the sample under observation includes a dielectric layer having a thickness greater than the radius of the tip of the AFM probe. A system for scanning near-field optical micro...