US Patent Issued to BorgWarner US Technologies on Feb. 17 for "Systems and methods for testing a capacitor in a circuit" (Singaporean Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,957, issued on Feb. 17, was assigned to BorgWarner US Technologies LLC (Wilmington, Del.).

"Systems and methods for testing a capacitor in a circuit" was invented by Karthik Naik (Singapore), Nomel Centino Navarro (Singapore) and Balasubramanian Muthuraman (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed techniques relate to a system for testing a capacitor. In an example, a testing circuit includes a testing voltage source configured to output a testing voltage to the capacitor; a discharge network configured to dissipate power from the capacitor; a voltage detection circuit configured to measure a voltage of the capacitor; a fir...