US Patent Issued to Beijing University of Technology on Nov. 3 for "In-situ mechanical micro-electro-mechanical device and system, as well as double-tilt sample holder" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,031, issued on Nov. 3, was assigned to Beijing University of Technology (Beijing).

"In-situ mechanical micro-electro-mechanical device and system, as well as double-tilt sample holder" was invented by Xiaodong Han (Beijing), Jiabao Zhang (Beijing), Jianfei Zhang (Beijing) and Xudong Yang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an in-situ mechanical micro-electro-mechanical device and system, as well as a double-tilt sample holder. A first displacement member is arranged in a first hollow-out cavity of a base through a first mechanical measurement assembly, extends to a third hollow-out cavity of the base, and is provided ...