ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,121, issued on July 14, was assigned to BAE Systems Information and Electronic Systems Integration Inc. (Nashua, N.H.).

"Angle ambiguity mitigation for interferometry" was invented by Ira B. Ekhaus (Arlington, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are provided for mitigating interferometric angle ambiguity. A methodology implementing the techniques according to an embodiment includes measuring a differential phase of a signal received at an interferometer baseline; calculating a Gaussian conditional probability of an angle of arrival of the signal based on the differential phase; calculating an angular position probability ...