ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,130, issued on Aug. 4, was assigned to ATECO INC. (Gunpo-si, South Korea).
"Test tray for semiconductor devices and test apparatus using the same" was invented by Taek Seon Lee (Hwaseong-si, South Korea), Ho Nam Kim (Seongnam-si, South Korea), Sung Chul Moon (Gunpo-si, South Korea), Han Su Bae (Siheung-si, South Korea) and Ju Hyun Kim (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a test for a semiconductor device, including: a test board that has a preparation surface on which a test tray with the semiconductor device mounted to an insert is prepared, and performs a test on the semiconductor device mounted to the ...