US Patent Issued to ASML NETHERLANDS on Feb. 17 for "Model for calculating a stochastic variation in an arbitrary pattern" (Arizona Inventor)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,203, issued on Feb. 17, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands).

"Model for calculating a stochastic variation in an arbitrary pattern" was invented by Steven George Hansen (Chandler, Ariz.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining a relationship between a stochastic variation of a characteristic of an aerial image or a resist image and one or more design variables, the method including: measuring values of the characteristic from a plurality of aerial images and/or resist images for each of a plurality of sets of values of the design variables; determining a value of the stochastic variation, for ...