ALEXANDRIA, Va., July 15 -- United States Patent no. 12,661,042, issued on June 23, was assigned to ARKRAY Inc. (Kyoto, Japan).
"Measurement device" was invented by Yuto Kanzaki (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A protective cover is attached to a measurement device. The measurement device is provided with an insertion aperture for insertion of a test strip onto which a liquid sample is spotted. The protective cover is attached to the measurement device so as to cover a region including surroundings of the insertion aperture. The protective cover is provided with an opening portion into which the test strip is insertable. The opening portion and the insertion aperture are relativel...