ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,466, issued on Aug. 18, was assigned to Arizona Board of Regents on Behalf of Arizona State University (Tempe, Ariz.).

"Systems and methods for carving probed metrology" was invented by Umberto Celano (Scottsdale, Ariz.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a body and a plurality of members extending from the apparatus configured to form carvings with different geometries along 2D layered semiconductor material. The apparatus includes conductive pins positioned along the plurality of members that accommodate individual sensing of current-voltage characteristics per carving. The carvings can include small stripes and th...