US Patent Issued to Applied Materials on Sept. 1 for "Optical inspection-based automatic defect classification" (Indian, American Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,241, issued on Sept. 1, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Optical inspection-based automatic defect classification" was invented by Navneet Kumar Singh (Fremont, Calif.), Arun Ramaswamy Srivatsa (Fremont, Calif.), Sachin Dangayach (San Jose, Calif.), Zvi Hersh Goldshtein (Sunnyvale, Calif.), Rahul Reddy Komatireddi (Hyderabad, India), Sutapa Dutta (Kolkata, India), Arv Nagpal (Bengaluru, India) and Yen-Tien Wu (Castro Valley, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations disclosed describe, among other things, a systems and techniques for perform efficient inspection of a semiconductor manufacturi...