ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,805, issued on March 31, was assigned to Applied Materials Inc. (Santa Clara, Calif.).
"Equipment parameter management at a manufacturing system using machine learning" was invented by Tsung-Liang Chen (South Hamilton, Mass.), Lars Henrik Schneider (Dresden, Germany) and Michael David Armacost (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes receiving first data associated with an equipment parameter. The first data is indicative of an equipment setting of a process tool of a plurality of process tools at a first manufacturing system. The method further includes providing the first data as input to a trained machin...