ALEXANDRIA, Va., July 21 -- United States Patent no. 12,690,413, issued on July 21, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Large format continuous imaging system" was invented by Venkatakaushik Voleti (San Jose, Calif.) and Mehdi Vaez-Iravani (Los Gatos, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scanning inspection apparatus detects anomalies on surfaces of objects such as substrates, substrates with bonded chiplets, and carriers with singulated chiplets and the like. In some embodiments, the inspection apparatus includes a time delay integrated (TDI) linear sensor with an optical input and a data output where more than one optical assembly is positioned adjacent to each...