US Patent Issued to Applied Materials on Aug. 11 for "Determining a substrate location threshold based on optical properties" (Texas Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,922, issued on Aug. 11, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Determining a substrate location threshold based on optical properties" was invented by Venkata Raghavaiah Chowdhary Kode (Pflugerville, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes an optical sensor including an emitting element and a receiving element. The optical sensor is configured to detect an optical transmission ratio of a substrate responsive to a substrate support supporting the substrate in an optical path of the first optical sensor. The system further includes a processing device communicatively coupled to the optical sensor....