US Patent Issued to Applied Materials Israel on Oct. 27 for "Nondestructive estimation of structural properties of a specimen via X-ray modelling based on simulations and ground truth measurements" (Israeli Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,968, issued on Oct. 27, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Nondestructive estimation of structural properties of a specimen via X-ray modelling based on simulations and ground truth measurements" was invented by Uri Hadar (Tel-Aviv, Israel), Doron Girmonsky (Raanana, Israel), Dror Shemesh (Hod Hasharon, Israel) and Michal Eilon (Beit-Elazari, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for non-destructive characterization of specimens that includes an electron beam (e-beam) source for projecting e-beams at one or more e-beam landing energies on a specimen; an X-ray detector for sensing X-rays emitted...