US Patent Issued to Applied Materials Israel on March 3 for "Optical inspection systems with pulsed light sources and pulse multiplexing" (Israeli, American Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,143, issued on March 3, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Optical inspection systems with pulsed light sources and pulse multiplexing" was invented by Elad Eizner (Nes Ziona, Israel), Haim Feldman (Nof-Ayalon, Israel), Boris Golberg (Ashdod, Israel), Ron Naftali (Shoham, Israel) and Keith Wells (Santa Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations disclosed describe, among other things, a sample inspection system that includes an illumination subsystem to illuminate a sample with a plurality of time-spaced light pulses generated, using a pulse multiplexing system, from a source light puls...