ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,727,281, issued on Sept. 1, was assigned to Apple Inc. (Cupertino, Calif.).

"Electromagnetic radiation detectors with lattice-matched epitaxial anti-reflection structures" was invented by Matthew T. Morea (Cupertino, Calif.), Daniel Mahgerefteh (Campbell, Calif.), Dylan N. Rees (Los Gatos, Calif.), Mark A. Arbore (Los Altos, Calif.) and Romain F. Chevallier (Santa Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electromagnetic radiation detectors includes anti-reflective epitaxial structures incorporated into an epitaxial stack of the electromagnetic radiation detector. An anti-reflective structures as described herein are grown between ...