US Patent Issued to Apple on May 12 for "Systems, methods, and devices for enhanced measurement gap sharing and measurement gap patterns" (Chinese, American, German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,022, issued on May 12, was assigned to Apple Inc. (Cupertino, Calif.).

"Systems, methods, and devices for enhanced measurement gap sharing and measurement gap patterns" was invented by Qiming Li (Beijing), Xiang Chen (Campbell, Calif.), Dawei Zhang (Saratoga, Calif.), Yang Tang (San Jose, Calif.), Jie Cui (San Jose, Calif.), Rolando E Bettancourt Ortega (Munich), Manasa Raghavan (Sunnyvale, Calif.) and Yuexia Song (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The techniques described herein provide enhanced measurement gap sharing solutions that enable measurement gap sharing for layer 1 (L1) measurements for serving and non-serving cells, ...