US Patent Issued to ANRITSU on Sept. 15 for "Spectroscopic measurement device and article inspection device including the same" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,466, issued on Sept. 15, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Spectroscopic measurement device and article inspection device including the same" was invented by Jyunichi Sano (Kanagawa, Japan), Eiji Taniguchi (Kanagawa, Japan) and Kohei Suzuki (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A spectroscopic measurement device capable of preventing entry of stray light into an optical fiber and preventing a decrease in accuracy of data of a spectrum of light incident on the optical fiber. The spectroscopic measurement device includes a light source unit, and a light detection unit in which transmission light transmitted t...