ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,447, issued on June 30, was assigned to ANRITSU Corp. (Kanagawa, Japan).
"Article inspection apparatus" was invented by Takashi Kanai (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An article inspection apparatus includes a detection data output unit that incorporates a detection signal from an X-ray detector to output detection data, an image generation unit that generates an inspection image, based on the detection data, a level conversion processing unit that adjusts the detection data to improve image quality of the inspection image, when a specific inspection condition which deteriorates the image quality of the inspection imag...