US Patent Issued to Anritsu on July 28 for "Dynamic low and high-frequency device characterization" (California Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,327, issued on July 28, was assigned to Anritsu Co. (Morgan Hill, Calif.).

"Dynamic low and high-frequency device characterization" was invented by Jon Martens (San Jose, Calif.) and Thomas H. Roberts (Morgan Hill, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Examples provide internally reconfigurable bias tees for a vector network analyzer. The bias tees can have component sizes that can be electronically switched during device testing. To reduce test time when multiple tests are conducted, examples can further provide for automatic tuning of one or more components of a bias tee, where the one or more components are tuned for the test bein...