US Patent Issued to ANRITSU on April 7 for "Mobile terminal test system and mobile terminal test method" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,598,482, issued on April 7, was assigned to ANRITSU Corp. (Kanagawa, Japan).

"Mobile terminal test system and mobile terminal test method" was invented by Wujie Gao (Kanagawa, Japan) and Ryota Chinbe (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A parameter calculation unit that calculates, according to one or more input values of a parameter, a value of another parameter, a standard conformance determination unit that determines whether or not the input value of the parameter and the value of the parameter calculated by the parameter calculation unit conform with a 3GPP standard, a parameter adjustment unit that adjusts a value of a p...