ALEXANDRIA, Va., June 9 -- United States Patent no. 12,648,704, issued on June 9, was assigned to Analog Devices Inc. (Wilmington, Mass.).
"Low frequency noise improvement in plethysmography measurement systems" was invented by Shrenik Deliwala (Andover, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A plethysmography ("PPG") measurement system may include at least one source of PPG radiation and at least one auxiliary sensor for detection of PPG radiation. The radiation source emits a portion of the PPG radiation toward a subject and another portion along an optical path for direct communication between the PPG radiation source and the auxiliary sensor. The auxiliary sensor may develop a profile again...