US Patent Issued to ams-OSRAM Internatioanl on March 17 for "Measurement method for characterization of a photodetector" (German Inventor)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,224, issued on March 17, was assigned to ams-OSRAM Internatioanl GmbH (Regensburg, Germany).

"Measurement method for characterization of a photodetector" was invented by Gerd Plechinger (Saal A.D. Donau, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement method for characterization of a photodetector includes illumination of the photodetector with a variable electromagnetic radiation. The variable electromagnetic radiation has a temporally oscillating radiation intensity with fixed period and amplitude. The method also includes illumination of the photodetector with a first electromagnetic radiation having a temporally constant fi...