US Patent Issued to AMS INTERNATIONAL on May 12 for "Integrated detector device and method of manufacturing an integrated detector device" (Swiss Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,446, issued on May 12, was assigned to AMS INTERNATIONAL AG (Jona, Switzerland).

"Integrated detector device and method of manufacturing an integrated detector device" was invented by Jens Hofrichter (Horgen, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated detector device for direct detection of X-ray photons includes a CMOS body including a substrate portion and a dielectric portion arranged on a main surface of the substrate portion, an integrated circuit in the CMOS body having implants at or above the main surface for forming charge collectors, and a metal structure in the dielectric portion that extends from the charge c...