ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,126, issued on Sept. 15, was assigned to Amazon Technologies Inc. (Seattle).
"Memory sub-channel reliability" was invented by Erez Sabbag (Koranit, Israel), Itai Avron (Petah Tikva, Israel) and Anat Arbely (Kiryat Tivon, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques to improve the reliability of volatile memory may include receiving a write request to store a data chunk in a volatile memory implemented using a memory module that contains a plurality of memory sub-channels. In response to the write request, a first write access is performed to write at least a first portion of the data chunk into a first memory sub-channel of the ...