US Patent Issued to Amazon Technologies on Feb. 17 for "Generating views for bias metrics and feature attribution captured in machine learning pipelines" (German, American Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,805, issued on Feb. 17, was assigned to Amazon Technologies Inc. (Seattle).

"Generating views for bias metrics and feature attribution captured in machine learning pipelines" was invented by Sanjiv Das (San Jose, Calif.), Michele Donini (Berlin), Jason Lawrence Gelman (Los Altos, Calif.), Kevin Haas (Los Gatos, Calif.), Tyler Stephen Hill (Los Altos, Calif.), Krishnaram Kenthapadi (Sunnyvale, Calif.), Pinar Altin Yilmaz (Palo Alto, Calif.), Muhammad Bilal Zafar (Berlin) and Pedro L Larroy (Redwood City, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Views may be generated for bias metrics or feature attribution captured in machine learning pi...