US Patent Issued to Amazon Technologies on Aug. 4 for "In-situ scan testing of an integrated circuit device" (Texas Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,135, issued on Aug. 4, was assigned to Amazon Technologies Inc. (Seattle).

"In-situ scan testing of an integrated circuit device" was invented by Brendan Tully (Austin, Texas), Matthew John Tilleman (Austin, Texas), Teja Adike (Georgetown, Texas), Don Tien Nguyen (Round Rock, Texas), Amit Pandey (Austin, Texas) and Akshay Maganti Vijay Kumar (Leander, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for performing in-situ scan testing of an integrated circuit (IC) device that is coupled to a main memory is described. The IC device has a plurality of functional circuit blocks, a management controller, and a local memory coupled via an int...