ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,819, issued on July 7, was assigned to Alliance Material Co. Ltd. (Hsinchu County, Taiwan).

"Probe pin cleaning pad and cleaning method for probe pin" was invented by Chun-Fa Chen (Hsinchu County, Taiwan), Yu-Hsuen Lee (Hsinchu County, Taiwan), Ching-Wen Hsu (Hsinchu County, Taiwan), Chao-Hsuan Yang (Hsinchu County, Taiwan) and Ting-Wei Lin (Hsinchu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe pin cleaning pad including a foam layer, a cleaning layer, and a polishing layer is provided. The cleaning layer is disposed between the foam layer and the polishing layer. A cleaning method for a probe pin is also provided."

The paten...