US Patent Issued to AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION on April 14 for "Apparatus and method for validating dataset based on feature coverage" (South Korean Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,596, issued on April 14, was assigned to AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION (Suwon-si, South Korea).

"Apparatus and method for validating dataset based on feature coverage" was invented by Jung Won Lee (Seoul, South Korea), Ye Seul Park (Incheon, South Korea) and Chang Nam Lim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A dataset validating method based on a feature coverage according to an exemplary embodiment of the present disclosure includes extracting a feature of a first dataset including a plurality of data using a classification model trained for a predetermined second dataset; clustering labe...